NI PXIe-2575高性能的32x8矩陣開關(guān)模塊
1.產(chǎn) 品 資 料 介 紹：
中文資料：
NI PXIe-2575是一種高性能的32x8矩陣開關(guān)模塊，用于構(gòu)建大規(guī)模的自動測試系統(tǒng)（ATE）或其他高速信號路由應(yīng)用。下面是關(guān)于NI PXIe-2575的配置說明、功能作用和應(yīng)用領(lǐng)域的詳細(xì)解釋：
配置說明：
- NI PXIe-2575基于PXI Express（PXIe）總線標(biāo)準(zhǔn)，需要插入到兼容的PXIe底板或機(jī)箱中使用。
- 它具有32個輸入通道和8個輸出通道，可支持高達(dá)256個單刀雙擲（SPDT）開關(guān)通路。
- 模塊提供了高達(dá)10 GHz的帶寬，適用于高速數(shù)字和射頻（RF）信號路由應(yīng)用。
- PXIe-2575還支持熱插拔功能，可方便地在測試系統(tǒng)中添加或更換開關(guān)模塊。
功能作用：
- NI PXIe-2575可用于信號切換和路由，以滿足自動測試系統(tǒng)中的各種需求。它可以在不同的測試通路之間進(jìn)行快速切換，實現(xiàn)多通道、多設(shè)備的高效測試。
- 該模塊的高帶寬和低插入損耗特性使其適用于高頻率和寬帶信號的傳輸和切換。它能夠保持信號完整性，確保測試精度和可靠性。
- PXIe-2575支持矩陣和廣播模式，可靈活地將輸入信號路由到多個輸出通道或?qū)⒍鄠€輸入信號路由到單個輸出通道。
- 該模塊還提供了豐富的軟件編程接口（如LabVIEW和NI Switch Executive等），使用戶可以輕松控制和集成開關(guān)模塊到測試系統(tǒng)中。
應(yīng)用領(lǐng)域：
- 自動測試設(shè)備（ATE）：PXIe-2575廣泛應(yīng)用于自動測試系統(tǒng)中，用于信號切換、測試通路選擇和多設(shè)備連接。它可以用于生產(chǎn)測試、射頻測試、高速數(shù)字測試等領(lǐng)域。
- 通信和無線電測試：該開關(guān)模塊在通信和無線電測試中可用于頻譜分析儀、信號發(fā)生器、功率計等儀器之間的信號切換和路由。
- 汽車電子測試：PXIe-2575可用于汽車電子模塊的功能測試和通信接口測試，支持多通道信號切換和路由。
- 高速數(shù)據(jù)采集與處理：在需要高速數(shù)據(jù)采集和處理的應(yīng)用中，該模塊可用于將傳感器信號切換到適當(dāng)?shù)牟杉坊蛱幚韱卧?，以實現(xiàn)高效的數(shù)據(jù)處理和分析。
英文資料：
NI PXIe-2575 is a high-performance 32x8 matrix switch module used to build large-scale Automatic Test Systems (ATE) or other high-speed signal routing applications. The following is a detailed explanation of the configuration, functional functions, and application areas of NI PXIe-2575:
Configuration instructions:
NI PXIe-2575 is based on the PXI Express (PXIE) bus standard and needs to be inserted into a compatible PXIE backplane or chassis for use.
It has 32 input channels and 8 output channels, and can support up to 256 single pole double throw (SPDT) switching channels.
The module provides a bandwidth of up to 10 GHz, suitable for high-speed digital and radio frequency (RF) signal routing applications.
PXIe-2575 also supports hot swapping function, making it easy to add or replace switch modules in the testing system.
Function:
NI PXIe-2575 can be used for signal switching and routing to meet various requirements in automatic testing systems. It can quickly switch between different testing paths, achieving efficient testing of multiple channels and devices.
The high bandwidth and low insertion loss characteristics of this module make it suitable for the transmission and switching of high-frequency and broadband signals. It can maintain signal integrity and ensure testing accuracy and reliability.
PXIe-2575 supports matrix and broadcast modes, allowing for flexible routing of input signals to multiple output channels or multiple input signals to a single output channel.
This module also provides rich software programming interfaces (such as LabVIEW and NI Switch Executive), allowing users to easily control and integrate switch modules into the testing system.
Application field:
Automatic Test Equipment (ATE): PXIe-2575 is widely used in automatic testing systems for signal switching, test path selection, and multi device connection. It can be used in production testing, RF testing, high-speed digital testing, and other fields.
Communication and radio test: the switch module can be used for signal switching and routing between spectrum analyzer, signal generator, power meter and other instruments in communication and radio test.
Automotive electronic testing: PXIe-2575 can be used for functional testing and communication interface testing of automotive electronic modules, supporting multi-channel signal switching and routing.
High speed data acquisition and processing: In applications that require high-speed data acquisition and processing, this module can be used to switch sensor signals to appropriate acquisition channels or processing units to achieve efficient data processing and analysis.
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